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      當前位置:首頁>會計知識> 原ASTM D5470-2006薄的熱導性固體電絕緣材料傳熱性能的測試標準先更新為ASTM D5470-2012

      原ASTM D5470-2006薄的熱導性固體電絕緣材料傳熱性能的測試標準先更新為ASTM D5470-2012

      原ASTM D5470-2006薄的熱導性固體電絕緣材料傳熱性能的測試標準先更新為ASTM D5470-2012:Designation: D5470 – 12 An American National StandardStand

      Designation: D5470 – 12 An American National Standard

      Standard Test Method for

      Thermal Transmission Properties of Thermally Conductive

      Electrical Insulation Materials1

      This standard is issued under the fixed designation D5470; the number immediately following the designation indicates the year of

      original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A

      superscript epsilon (´) indicates an editorial change since the last revision or reapproval.

      This standard has been approved for use by agencies of the Department of Defense.

      1. Scope*

      1.1 This standard covers a test method for measurement of

      thermal impedance and calculation of an apparent thermal

      conductivity for thermally conductive electrical insulation

      materials ranging from liquid compounds to hard solid materials.

      1.2 The term “thermal conductivity” applies only to homogeneous

      materials. Thermally conductive electrical insulating

      materials are usually heterogeneous and to avoid confusion this

      test method uses “apparent thermal conductivity” for determining

      thermal transmission properties of both homogeneous and

      heterogeneous materials.

      1.3 The values stated in SI units are to be regarded as

      standard.

      1.4 This standard does not purport to address all of the

      safety concerns, if any, associated with its use. It is the

      responsibility of the user of this standard to establish appropriate

      safety and health practices and determine the applicability

      of regulatory limitations prior to use.

      2. Referenced Documents

      2.1 ASTM Standards:2

      D374 Test Methods for Thickness of Solid Electrical Insulation

      E691 Practice for Conducting an Interlaboratory Study to

      Determine the Precision of a Test Method

      E1225 Test Method for Thermal Conductivity of Solids by

      Means of the Guarded-Comparative-Longitudinal Heat

      Flow Technique

      3. Terminology

      3.1 Definitions of Terms Specific to This Standard:

      3.1.1 apparent thermal conductivity (l), n—the time rate of

      heat flow, under steady conditions, through unit area of a

      heterogeneous material, per unit temperature gradient in the

      direction perpendicular to the area.

      3.1.2 average temperature (of a surface), n—the areaweighted

      mean temperature.

      3.1.3 composite, n—a material made up of distinct parts

      which contribute, either proportionally or synergistically, to the

      properties of the combination.

      3.1.4 homogeneous material, n—a material in which relevant

      properties are not a function of the position within the

      material.

      3.1.5 thermal impedance (u), n—the total opposition that an

      assembly (material, material interfaces) presents to the flow of

      heat.

      3.1.6 thermal interfacial resistance (contact resistance),

      n—the temperature difference required to produce a unit of

      heat flux at the contact planes between the specimen surfaces

      and the hot and cold surfaces in contact with the specimen

      under test. The symbol for contact resistance is RI.

      3.1.7 thermal resistivity, n—the reciprocal of thermal conductivity.

      Under steady-state conditions, the temperature gradient,

      in the direction perpendicular to the isothermal surface

      per unit of heat flux.

      3.2 Symbols Used in This Standard:

      3.2.1 l = apparent thermal conductivity, W/m·K.

      3.2.2 A = area of a specimen, m2.

      3.2.3 d = thickness of specimen, m.

      3.2.4 Q = time rate of heat flow, W or J/s.

      3.2.5 q = heat flux, or time rate of heat flow per unit area,

      W/m2.

      3.2.6 u = thermal impedance, temperature difference per

      unit of heat flux, (K·m2)/W.

      4. Summary of Test Method

      4.1 This standard is based on idealized heat conduction

      between two parallel, isothermal surfaces separated by a test

      specimen of uniform thickness. The thermal gradient imposed

      on the specimen by the temperature difference between the two

      contacting surfaces causes the heat flow through the specimen.

      This heat flow is perpendicular to the test surfaces and is

      uniform across the surfaces with no lateral heat spreading.

      1 This test method is under the jurisdiction of ASTM Committee D09 on

      Electrical and Electronic Insulating Materials and is the direct responsibility of

      Subcommittee D09.19 on Dielectric Sheet and Roll Products.

      Current edition approved Jan. 1, 2012. Published February 2012. Originally

      approved in 1993. Last previous edition approved in 2011 as D5470 – 11. DOI:

      10.1520/D5470-12.

      2 For referenced ASTM standards, visit the ASTM website, , or

      contact ASTM Customer Service at service. For Annual Book of ASTM

      Standards volume information, refer to the standard’s Document Summary page on

      the ASTM website.

      1

      *A Summary of Changes section appears at the end of this standard.

      Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.

      原ASTM D5470-2006薄的熱導性固體電絕緣材料傳熱性能的測試標準先更新為ASTM D5470-2012

      Copyright ASTM International

      Provided by IHS under license with ASTM

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      4.2 The measurements required by this standard when using

      two meter bars are:

      T1 = hotter temperature of the hot meter bar, K,

      T2 = colder temperature of the hot meter bar, K,

      T3 = hotter temperature of the cold meter bar, K,

      T4 = colder temperature of the cold meter bar, K,

      A = area of the test surfaces, m2, and

      d = specimen thickness, m.

      4.3 Based on the idealized test configuration, measurements

      are taken to compute the following parameters:

      TH = the temperature of the hotter isothermal surface, K,

      TC = the temperature of the colder isothermal surface, K,

      Q = the heat flow rate between the two isothermal surfaces,

      W,

      thermal impedance = the temperature difference between the

      two isothermal surfaces pided by the heat flux through them,

      K·m2/W, and

      apparent thermal conductivity = calculated from a plot of

      specimen thermal impedance versus thickness, W/m·K.

      4.4 Interfacial thermal resistance exists between the specimen

      and the test surfaces. These contact resistances are

      included in the specimen thermal impedance computation.

      Contact resistance varies widely depending on the nature of the

      specimen surface and the mechanical pressure applied to the

      specimen by the test surfaces. The clamping pressure applied to

      the specimen should therefore be measured and recorded as a

      secondary measurement required for the method except in the

      case of fluidic samples (Type I, see section 5.3.1) where the

      applied pressure is insignificant. The computation for thermal

      impedance is comprised of the sum of the specimen thermal

      resistance plus the interfacial thermal resistance.

      4.5 Calculation of apparent thermal conductivity requires an

      accurate determination of the specimen thickness under test.

      Different means can be used to control, monitor, and measure

      the test specimen thickness depending on the material type.

      4.5.1 The test specimen thickness under test can be controlled

      with shims or mechanical stops if the dimension of the

      specimen can change during the test.

      4.5.2 The test specimen thickness can be monitored under

      test with an in situ thickness measurement if the dimension of

      the specimen can change during the test.

      4.5.3 The test specimen thickness can be measured as

      manufactured at room temperature in accordance with Test

      Methods D374 Test Method C if it exhibits negligible compression

      deflection.

      5. Significance and Use

      5.1 This standard measures the steady state thermal impedance

      of electrical insulating materials used to enhance heat

      transfer in electrical and electronic applications. This standard

      is especially useful for measuring thermal transmission properties

      of specimens that are either too thin or have insufficient

      mechanical stability to allow placement of temperature sensors

      in the specimen as in Test Method E1225.

      5.2 This standard imposes an idealized heat flow pattern and

      specifies an average specimen test temperature. The thermal

      impedances thus measured cannot be directly applied to most

      practical applications where these required uniform, parallel

      heat conduction conditions do not exist.

      5.3 This standard is useful for measuring the thermal

      impedance of the following material types.

      5.3.1 Type I—Viscous liquids that exhibit unlimited deformation

      when a stress is applied. These include liquid compounds

      such as greases, pastes, and phase change materials.

      These materials exhibit no evidence of elastic behavior or the

      tendency to return to initial shape after deflection stresses are

      removed.

      5.3.2 Type II—Viscoelastic solids where stresses of deformation

      are ultimately balanced by internal material stresses

      thus limiting further deformation. Examples include gels, soft,

      and hard rubbers. These materials exhibit linear elastic properties

      with significant deflection relative to material thickness.

      5.3.3 Type III—Elastic solids which exhibit negligible deflection.

      Examples include ceramics, metals, and some types of

      plastics.

      5.4 The apparent thermal conductivity of a specimen can be

      calculated from the measured thermal impedance and measured

      specimen thickness if the interfacial thermal resistance is

      insignificantly small (nominally less than 1 %) compared to the

      thermal resistance of the specimen.

      5.4.1 The apparent thermal conductivity of a sample material

      can be accurately determined by excluding the interfacial

      thermal resistance. This is accomplished by measuring the

      thermal impedance of different thicknesses of the material

      under test and plotting thermal impedance versus thickness.

      The inverse of the slope of the resulting straight line is the

      apparent thermal conductivity. The intercept at zero thickness

      is the sum of the contact resistances at the two surfaces.

      5.4.2 The contact resistance can be reduced by applying

      thermal grease or oil to the test surfaces of rigid test specimens

      (Type III).

      TEST METHOD

      6. Apparatus

      6.1 The general features of an apparatus that meets the

      requirements of this method are shown in Figs. 1 and 2. This

      apparatus imposes the required test conditions and accomplishes

      the required measurements. It should be considered to

      be one possible engineering solution, not a uniquely exclusive

      implementation.

      6.2 The test surfaces are to be smooth within 0.4 microns

      and parallel to within 5 microns.

      6.3 The heat sources are either electrical heaters or temperature

      controlled fluid circulators. Typical electrical heaters are

      made by embedding wire wound cartridge heaters in a highly

      conductive metal block. Circulated fluid heaters consist of a

      metal block heat exchanger through which a controlled temperature

      fluid is circulated to provide the required heat flow as

      well as temperature control.

      6.4 Heat flow through the specimen can be measured with

      meter bars regardless of the type of heater used.

      6.4.1 Electrical heaters offer convenient measurement of the

      heating power generated but must be combined with a guard

      heater and high quality insulation to limit heat leakage away

      from the primary flow through the specimen.

      D5470 – 12

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      6.4.2 Heat flow meter bars can be constructed from high

      conductivity materials with well documented thermal conductivity

      within the temperature range of interest. The temperature

      sensitivity of thermal conductivity must be considered for

      accurate heat flow measurement. The thermal conductivity of

      the bar material is recommended to be greater than 50 W/m·K.

      6.4.3 Guard heaters are comprised of heated shields around

      the primary heat source to eliminate heat leakage to the

      environment. Guard heaters are insulated from the heat source

      and maintained at a temperature within 60.2 K of the heater.

      This effectively reduces the heat leakage from the primary

      heater by nullifying the temperature difference across the

      insulation. Insulation between the guard heater and the heat

      source should be at least the equivalent of one 5 mm layer of

      FR-4 epoxy material.

      6.4.4 If the heat flow meter bars are used on both the hot and

      cold surfaces, guard heaters and thermal insulation is not

      required and the heat flow through the test specimen is

      computed as the average heat flow through both meter bars.

      6.5 Meter bars can also be used to determine the temperature

      of the test surfaces by extrapolating the linear array of

      meter bar temperatures to the test surfaces. This can be done

      for both the hot side and cold side meter bars. Surface

      temperatures can also be measured with thermocouples that are

      located in extreme proximity to the surfaces although this can

      be mechanically difficult to achieve. Meter bars can be used for

      both heat flow and surface temperature measurement or for

      exclusively one of these functions.

      6.6 The cooling unit is commonly implemented with a metal

      block cooled by temperature controlled circulating fluid with a

      temperature stability of 60.2 K.

      6.7 The contact pressure on the specimen can be controlled

      and maintained in a variety of ways, including linear actuators,

      lead screws, pneumatics, and hydraulics. The desired range of

      forces must be applied to the test fixture in a direction that is

      perpendicular to the test surfaces and maintains the parallelism

      and alignment of the surfaces.

      7. Preparation of Test Specimens

      7.1 The material type will dictate the method for controlling

      specimen thickness. In all cases, prepare specimens of the same

      area as the contacting test surfaces. If the test surfaces are not

      of equal size, prepare the specimen equal to the dimension of

      the smaller test surface.

      FIG. 1 Test Stack Using the Meter Bars as Calorimeters

      FIG. 2 Guarded Heater Test Stack

      D5470 – 12

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      7.1.1 Type I—Use shims or mechanical stops to control the

      thickness of the specimen between the test surfaces. Spacer

      beads of the desired diameter can also be used in approximately

      2 % volumetric ratio and thoroughly mixed into the

      sample prior to being applied to the test surfaces.

      7.1.2 Type II—Use an adjustable clamping pressure to

      deflect the test specimen by 5 % of its uncompressed thickness.

      This represents a trade-off between lower surface contact

      resistance and excessive sample deflection.

      7.1.3 Type III—Measure the sample thickness in accordance

      with Test Method C of Test Methods D374.

      7.2 Prepare specimens from material that is in original,

      as-manufactured condition or as noted otherwise. Remove any

      contamination and dirt particles. Do not use solvent that will

      react with or contaminate the specimens.

      8. Procedure

      8.1 Determination of test specimen thickness.

      8.1.1 Machines with in situ thickness measurement apparatus.

      8.1.1.1 Close the test stack and apply the clamping pressure

      required for the specimen to be tested.

      8.1.1.2 Turn on the heating and cooling units and let

      stabilize at the specified set points to give an average sample

      temperature of 50°C (average of T2 and T3), unless otherwise

      specified.

      8.1.1.3 Zero the thickness measuring device (micrometer,

      LVDT, laser detector, encoder, etc.).

      8.1.2 Machines without an in situ thickness measuring

      apparatus.

      8.1.2.1 At room temperature, measure the specimen thickness

      in accordance with Test Method C of Test Methods D374.

      8.2 Load the specimen on the lower test stack.

      8.2.1 Dispense Type I grease and paste materials onto the

      lower test stack surface. Melt phase change compounds to

      dispense onto the stack.

      8.2.2 Place Type II and III specimens onto the lower test

      stack.

      8.3 Close the test stack and apply clamping pressure.

      8.3.1 Type I materials being tested with shims to control the

      test thickness require only enough pressure to squeeze out

      excess material and contact the shim but not too much pressure

      that will result in the shim damaging the surfaces of the test

      stacks.

      8.3.1.1 For machines with screw stops, electromechanical,

      or hydraulic actuators controlling the position of the upper test

      stack, the magnitude of the clamping pressure is not critical.

      8.3.1.2 Raise the temperature of the test stack above the

      specimen melting point to enable phase change materials to

      flow and permit closing of the test stacks. After the material has

      flowed, return the heating and cooling units to the required set

      points to maintain an average specimen temperature of 50°C

      before beginning the test, unless otherwise specified.

      8.3.2 Type II materials require enough pressure to coalesce

      stacked specimens together and minimize interfacial thermal

      resistances. Too much pressure can damage the specimens.

      This can be as low as 0.069 MPa (10 psi) for softer specimens

      or as high as 3.4 MPa (500 psi) for harder specimens.

      Alternatively, screws or linear actuators can be used to control

      the specimen thickness under test for easily deformable Type II

      materials.

      8.3.3 Type III materials require enough pressure to exclude

      excess thermal grease from the interface and to flatten specimens

      that are not flat. This can be as low as 0.69 MPa (100 psi)

      for flat specimens with low viscosity thermal grease or as high

      as 3.4 MPa (500 psi) for non-flat specimens or when using high

      viscosity thermal grease.

      8.4 Record the temperatures of the meter bars and the

      voltage and current applied to electrical heaters at equilibrium.

      Equilibrium is attained when, at constant power, 2 sets of

      temperature readings taken at 5 minute intervals differ by less

      than 60.1°C, or if the thermal impedance has changed by less

      than 1 % of the current thermal impedance over a 5 minute

      time span.

      8.5 Calculate the mean specimen temperature and the thermal

      impedance. Label the calculated thermal impedance for the

      single-layer specimen as the “thermal impedance” of the

      sample.

      8.6 Determine the thermal impedance of at least 3 specimen

      thicknesses. Maintain the mean temperature of the specimens

      at 50 6 2°C (unless otherwise specified) by reducing the heat

      flux as the specimen thickness is increased.

      8.6.1 For specimens that need to be stacked to get different

      thicknesses, first measure the thermal impedance of one layer

      alone, then measure the thermal impedance of 2 layers stacked

      together, and then measure the thermal impedance of 3 layers

      stacked together.

      8.6.2 For specimens of 3 different thicknesses A, B, and C,

      first measure the thermal impedance of specimen A alone, then

      measure the thermal impedance of specimen B alone, then

      measure the thermal impedance of specimen C alone.

      9. Calculation

      9.1 Heat Flow:

      9.1.1 Heat Flow When Using the Meter Bars For

      Calorimeters—Calculate the heat flow from the meter bar

      readings as follows:

      Q12 5

      l12 3 A

      d 3 @T1 – T2# (1)

      Q34 5

      l34 3 A

      d 3 @T3 – T4# (2)

      Q 5

      Q12 1 Q34

      2 (3)

      where:

      Q12 = heat flow in hot meter bar, W,

      Q34 = heat flow in cold meter bar, W,

      Q = average heat flow through specimen, W,

      l12 = thermal conductivity of the hot meter bar material,

      W/(m·K),

      l34 = thermal conductivity of the cold meter bar material,

      W/(m·K),

      A = area of the reference calorimeter, m2,

      T1 – T2 = temperature difference between temperature sensors

      of the hot meter bar, K,

      T3 – T4 = temperature difference between temperature sensors

      of the cold meter bar, K, and

      D5470 – 12

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      d = distance between temperature sensors in the

      meter bars, m.

      9.1.2 Heat Flow When Not Using the Meter Bars for

      Calorimeters—Calculate the heat flow from the applied electrical

      power as follows:

      Q 5 V 3 I (4)

      where:

      Q = heat flow, W,

      V = electrical potential applied to the heater, V, and

      I = electrical current flow in the heater, A.

      9.2 Derive the temperature of the hot meter bar surface in

      contact with the specimen from the following:

      TH 5 T2 –

      dB

      dA

      3 @T1 – T2# (5)

      where:

      TH = temperature of the hot meter bar surface in contact

      with the specimen, K,

      T1 = warmer temperature of the hot meter bar, K,

      T2 = cooler temperature of the hot meter bar, K,

      dA = distance between T1 and T2, m, and

      dB = distance from T2 to the surface of the hot meter bar in

      contact with the specimen, m.

      9.3 Derive the temperature of the cold meter bar surface in

      contact with the specimen from the following:

      TC 5 T3 1

      dD

      dC

      3 @T3 – T4# (6)

      where:

      TC = temperature of the cold meter bar surface in contact

      with the specimen, K,

      T3 = warmer temperature of the cold meter bar, K,

      T4 = cooler temperature of the cold meter bar, K,

      dC = distance between T3 and T4, m, and

      dD = distance from T3 to the surface of the cold meter bar

      in contact with the specimen, m.

      9.4 Calculate the thermal impedance from Eq 7 and express

      it in units of (K·m2)/W:

      u 5

      A

      Q 3 @TH – TC# (7)

      9.5 Obtain apparent thermal conductivity from a plot of

      thermal impedance for single and multiple layered specimens

      against the respective specimen thickness. Plot values of the

      specimen thickness on the x axis and specimen thermal

      impedance on the y axis.

      9.5.1 The curve is a straight line whose slope is the

      reciprocal of the apparent thermal conductivity. The intercept

      at zero thickness is the thermal interfacial resistance, RI,

      specific to the sample, clamping force used, and the clamping

      surfaces.

      9.5.2 As a preferred alternative, compute the slope and the

      intercept using least mean squares or linear regression analysis.

      10. Report

      10.1 Report the following information:

      10.1.1 Specimen identification:

      10.1.1.1 Name of the manufacturer,

      10.1.1.2 Batch or lot number,

      10.1.1.3 Grade designation,

      10.1.1.4 Nominal thickness, and

      10.1.1.5 Any other information pertinent to the identification

      of the material.

      10.1.2 Number of layers used in the test.

      10.1.3 Average temperature of the specimen, if other than

      323 K.

      10.1.4 Pressure used during testing,

      10.1.5 Thermal transmission properties:

      10.1.5.1 Apparent thermal conductivity from 9.5, and

      10.1.5.2 Thermal impedance from 9.4 (normalized to nominal

      thickness for Type II materials).

      11. Precision and Bias

      11.1 A round robin was conducted on five Type II materials

      having different constructions and thicknesses. Six laboratories

      tested specimens from all of the materials using either the

      specified test method or additional Test Method B of this

      standard, which is now deleted. Table 1, prepared in accordance

      with Practice E691, summarizes the results of the round

      robin. Data obtained during the round-robin testing are being

      made available in a research report.

      11.2 From the data used to generate Table 1 the following

      conclusion is made:

      11.2.1 Thermal conductivity values for the same material

      measured in different laboratories are expected to be within

      18 % of the mean of the values from all of the laboratories.

      11.3 Bias for this test method is currently under investigation

      subject to the availability of a suitable reference material.

      12. Keywords

      12.1 apparent thermal conductivity; guarded heater method;

      thermal conductivity; thermal impedance; thermally conductive

      electrical insulation

      TABLE 1 Precision for Conductivity Measurement

      NOTE 1—Values are in units of watt per meter Kelvin.

      Material Identity Average Sr

      A SR

      B rC RD

      Material B 0.923 0.0383 0.163 0.107 0.456

      Material E 1.245 0.0834 0.175 0.234 0.491

      Material C 1.311 0.0423 0.192 0.119 0.536

      Material A 2.732 0.2010 0.311 0.563 0.872

      Material D 5.445 0.5691 0.711 1.594 1.991

      A Sr = within-laboratory standard deviation of the average.

      B SR = between-laboratories standard deviation of the average.

      C r = within-laboratory repeatability limit = 2.8 3 Sr.

      D R = between-laboratories reproducibility limit = 2.8 3 SR.

      D5470 – 12

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      SUMMARY OF CHANGES

      Committee D09 has identified the location of selected changes to this test method since the last issue,

      D5470 – 01, that may impact the use of this test method. (Approved April 1, 2006)

      (1) The test method was heavily revised throughout to remove

      non-mandatory language and to clarify mandatory aspects in

      the method, apparatus, specimens, and procedures.

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      (). Permission rights to photocopy the standard may also be secured from the ASTM website (/

      原創作者:湘潭市儀器儀表有限公司

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